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JNC TN1440 2000-007, 115 Pages, 2000/08

JNC-TN1440-2000-007.pdf:4.45MB

no abstracts in English

Imaging XAFS analysis of secondary waste generated in the treatment process of contaminated water

Okamoto, Yoshihiro; Watanabe, So; Nagai, Takayuki; Kitawaki, Shinichi; Shibata, Atsuhiro; Nomura, Kazunori; Shiwaku, Hideaki

no journal, , 

Imaging XAFS analysis of simulated secondary waste generated from the treatment process of contaminated water in the Fukushima Daiichi Plant. The object in this study was titanate adsorption materials to collect strontium. Imaging XAFS data of the frame element Ti in the adsorption material and the target element Sr were obtained in the same domain of samples. Radiation effects in the secondary waste were simulated by -ray and electron beam irradiation.